X-ray Powder Diffraction
X-ray diffraction (XRD) is used for polycrystalline material analysis. The instrument uses the classic Bragg-Brentano configuration to obtain data for qualitative and quantitative crystalline phase identification, crystallinity determination and structure investigations When a parallel beam of X-rays is directed upon a crystalline material the crystal planes will diffract the beam to form an interference pattern. For constructive interference, the interplanar spacing relates to the incident X-rays according to the Bragg equation: 2d.sinθ = nλ. By varying the diffraction angle 2θ this method generates an X-ray diffraction pattern consisting of a series of sharp peaks of differing intensity. The 2θ angle at which a peak occurs corresponds to a particular interplanar spacing of the crystalline content of the material.
Typical industrial uses
Minerals and ceramics
- Geological material identification
- Anode coke characterization
- Cement phase quantification
- Gypsum/anhydrite phase quantification
Polymers and composites
- Percentage crystallinity
- Additive identification
- Texture analysis
Paint and pigments
- White pigments quantification
Pharmaceuticals
- Development and formulation
- Durability and aging studies
Key Capabilities
- Phase identification and quantification
- Crystal structure analysis
- Degree of crystallinity determination
- Phase properties (cell parameters, crystallite size, and lattice strain)
- Qualitative texture analysis
Bruker AXS D2 PHASER desktop X-ray diffraction (XRD) system
System Specification:
- Standard ceramic sealed copper X-ray tube (wavelength kα - 1.5418 Å)
- X-ray generation 30 kV / 10 mA
- 1-dimensional LynxEYE™ compound silicon-strip X-ray detector for high speed data collection
- Maximum useable angular range 3 - 160 ° (2θ)
Are you interested in using this technique?
If you are interested in using this technique and would like further information please do not hesitate to get in touch.